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Equivalent circuit of a metal-insulator-semiconductor structure

โœ Scribed by F. Forlani; N. Minnaja; E. Pagiola


Publisher
Elsevier Science
Year
1967
Tongue
English
Weight
892 KB
Volume
10
Category
Article
ISSN
0038-1101

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Method of metal-insulator-semiconductor
โœ Bondarenko, G. G.; Andreev, V. V.; Loskutov, S. A.; Stolyarov, A. A. ๐Ÿ“‚ Article ๐Ÿ“… 1999 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 79 KB ๐Ÿ‘ 1 views

The method of metal-insulator-semiconductor (MIS) structure interface analysis, based on applying a direct current pulse of preset amplitude to a MIS structure, is proposed. The variation of the voltage across the MIS structure is recorded while the current flows. The method allows measurement of in