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Depletion widths of the metal-insulator semiconductor (MIS) structure

✍ Scribed by Chein Wei Jen; Chung Len Lee; Tan Fu Lei

Publisher
Elsevier Science
Year
1981
Tongue
English
Weight
484 KB
Volume
24
Category
Article
ISSN
0038-1101

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Method of metal-insulator-semiconductor
Method of metal-insulator-semiconductor structure interface analysis
✍ Bondarenko, G. G.; Andreev, V. V.; Loskutov, S. A.; Stolyarov, A. A. πŸ“‚ Article πŸ“… 1999 πŸ› John Wiley and Sons 🌐 English βš– 79 KB πŸ‘ 1 views

The method of metal-insulator-semiconductor (MIS) structure interface analysis, based on applying a direct current pulse of preset amplitude to a MIS structure, is proposed. The variation of the voltage across the MIS structure is recorded while the current flows. The method allows measurement of in