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EPR, XRD and optical reflectivity studies of radiation damage in silicon after high energy implantation of Ni ions

✍ Scribed by V.S. Varichenko; A.M. Zaitsev; J.K.N. Lindner; R. Domres; N.M. Penina; D.P. Erchak; A.R. Chelyadinskii; V.A. Martinovitsh


Book ID
113285421
Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
630 KB
Volume
94
Category
Article
ISSN
0168-583X

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