The use of ion scattering for the study of radiation damage in metals and semiconductors: I. High energy scattering studies. II. Low energy scattering studies of ion bombardment induced surface damage

✍ Scribed by DG Armour

• Publisher: Elsevier Science
• Year: 1982
• Tongue: English
• Weight: 62 KB
• Volume: 32
• Category: Article
• ISSN: 0042-207X
• DOI: 10.1016/0042-207x(82)93789-7