The use og ion scattering for the study of radiation damage in metal and semiconductors: I. High energy scattering studies. II. Low energy scattering studies of ion bombardent induced surface damage: D G Armour, Vacuum, 32 (9), 1982, 573

• Publisher: Elsevier Science
• Year: 1985
• Tongue: English
• Weight: 291 KB
• Volume: 35
• Category: Article
• ISSN: 0042-207X
• DOI: 10.1016/0042-207x(85)90568-8