✦ LIBER ✦
An IR-reflectivity and X-ray diffraction study of high energy He-ion implantation-induced damage in 4H–SiC
✍ Scribed by A. Declémy; E. Oliviero; M.F. Beaufort; J.F. Barbot; M.L. David; C. Blanchard; Y. Tessier; E. Ntsoenzok
- Book ID
- 114165205
- Publisher
- Elsevier Science
- Year
- 2002
- Tongue
- English
- Weight
- 207 KB
- Volume
- 186
- Category
- Article
- ISSN
- 0168-583X
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