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Ellipsometry studies of albumin films on tantalum oxide and SiO2

✍ Scribed by S.M. Ma; D.L. Coleman; J.D. Andrade

Book ID: 118981704
Publisher: Elsevier Science
Year: 1976
Tongue: English
Weight: 528 KB
Volume: 56
Category: Article
ISSN: 0039-6028
DOI: 10.1016/0039-6028(76)90439-8

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