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Morphology and ellipsometry study of pentacene films grown on native SiO2 and glass substrates

✍ Scribed by Chaeho Kim; Kyoungyoon Bang; Ilsin An; C.J. Kang; Y.S. Kim; D. Jeon

Book ID: 108078950
Publisher: Elsevier Science
Year: 2006
Tongue: English
Weight: 464 KB
Volume: 6
Category: Article
ISSN: 1567-1739
DOI: 10.1016/j.cap.2005.01.041

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