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Electron valence-band tunnelling excess noise in twin-gate silicon-on-insulator MOSFETs

✍ Scribed by E. Simoen; C. Claeys; N. Lukyanchikova; N. Garbar; A. Smolanka; P. Ghedini Der Agopian; J.A. Martino

Book ID: 108269511
Publisher: Elsevier Science
Year: 2006
Tongue: English
Weight: 223 KB
Volume: 50
Category: Article
ISSN: 0038-1101
DOI: 10.1016/j.sse.2005.10.038

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