✦ LIBER ✦
Excess low-frequency noise in ultrathin oxide n-MOSFETs arising from valence-band electron tunneling
✍ Scribed by Jun-Wei Wu; Jian-Wen You; Huan-Chi Ma; Chih-Chang Cheng; Chang-Feng Hsu; Chih-Sheng Chang; Gou-Wei Huang; Tahui Wang
- Book ID
- 114617933
- Publisher
- IEEE
- Year
- 2005
- Tongue
- English
- Weight
- 510 KB
- Volume
- 52
- Category
- Article
- ISSN
- 0018-9383
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