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Analytical Model for the Impact of the Twin Gate on the Floating-Body-Related Low-Frequency Noise Overshoot in Silicon-on-Insulator MOSFETs

✍ Scribed by Nataliya Lukyanchikova; Nikolay Garbar; Alexander Smolanka; Valeriya Kudina; Cor Claeys; Eddy Simoen

No coin nor oath required. For personal study only.

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