"Linear kink effect" induced by electron valence band tunneling in ultrathin gate oxide bulk and SOI MOSFETS

✍ Scribed by Mercha, A.; Rafi, J.M.; Simoen, E.; Augendre, E.; Claeys, C.

• Book ID: 111676745
• Publisher: IEEE
• Year: 2003
• Tongue: English
• Weight: 624 KB
• Volume: 50
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2003.814983