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Electron trapping in irradiated SIMOX buried oxides

✍ Scribed by T. Ouisse; S. Cristoloveanu; G. Borel

Book ID: 124166140
Publisher: IEEE
Year: 1991
Tongue: English
Weight: 251 KB
Volume: 12
Category: Article
ISSN: 0741-3106
DOI: 10.1109/55.82071

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