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Electron Channeling and Ion Channeling Contrast Imaging of Dislocations in Nitride Thin Films

✍ Scribed by Trager-Cowan, C; Sweeney, F; Edwards, PR; Dynowski, FL; Wilkinson, AJ; Winkelmann, A; Day, AP; Wang, T; Parbrook, PJ; Watson, IM; Joy, DC

Book ID: 119993769
Publisher: Cambridge University Press
Year: 2008
Tongue: English
Weight: 320 KB
Volume: 14
Category: Article
ISSN: 1431-9276
DOI: 10.1017/S1431927608086856

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