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Accurate electron channeling contrast analysis of dislocations in fine grained bulk materials

✍ Scribed by Mansour, H.; Guyon, J.; Crimp, M.A.; Gey, N.; Beausir, B.; Maloufi, N.


Book ID
122247525
Publisher
Elsevier Science
Year
2014
Tongue
English
Weight
805 KB
Volume
84-85
Category
Article
ISSN
1359-6462

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## Abstract The imaging and characterization of dislocations is commonly carried out by thin foil transmission electron microscopy (TEM) using diffraction contrast imaging. However, the thin foil approach is limited by difficult sample preparation, thin foil artifacts, relatively small viewable are