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Electron backscatter diffraction and electron channeling contrast imaging of tilt and dislocations in nitride thin films

✍ Scribed by Trager-Cowan, C.; Sweeney, F.; Trimby, P. W.; Day, A. P.; Gholinia, A.; Schmidt, N.-H.; Parbrook, P. J.; Wilkinson, A. J.; Watson, I. M.

Book ID: 118019497
Publisher: The American Physical Society
Year: 2007
Tongue: English
Weight: 926 KB
Volume: 75
Category: Article
ISSN: 1098-0121
DOI: 10.1103/physrevb.75.085301

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