Epitaxial SiC Growth Morphology and Extended Defects Investigated by Electron Backscatter Diffraction and Electron Channeling Contrast Imaging

✍ Scribed by Yoosuf N. Picard; Mark E. Twigg; Joshua D. Caldwell; Charles R. Eddy; Philip G. Neudeck; Andrew J. Trunek; J. Anthony Powell

• Book ID: 107455044
• Publisher: Springer US
• Year: 2007
• Tongue: English
• Weight: 536 KB
• Volume: 37
• Category: Article
• ISSN: 0361-5235
• DOI: 10.1007/s11664-007-0308-0