Multibeam electron source for nanofabric
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M.J. van Bruggen; B. van Someren; P. Kruit
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Article
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2006
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Elsevier Science
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English
โ 375 KB
A multibeam electron beam induced deposition (EBID) system is presented, which can be used for the fabrication of sub-10 nm structures with EBID. This system consists of a scanning electron microscope (SEM) column and a modified source section with a microfabricated lens array. This lens array produ