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Electron-beam-induced current study of small-angle grain boundaries in multicrystalline silicon

✍ Scribed by J. Chen; T. Sekiguchi; R. Xie; P. Ahmet; T. Chikyo; D. Yang; S. Ito; F. Yin

Book ID: 113895466
Publisher: Elsevier Science
Year: 2005
Tongue: English
Weight: 297 KB
Volume: 52
Category: Article
ISSN: 1359-6462
DOI: 10.1016/j.scriptamat.2005.03.010

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