Numerical simulation of electron-beam-induced current near a silicon grain boundary and impact of a p–n junction space charge region

✍ Scribed by Richard Corkish; Pietro P Altermatt; Gernot Heiser

• Book ID: 108472159
• Publisher: Elsevier Science
• Year: 2001
• Tongue: English
• Weight: 167 KB
• Volume: 65
• Category: Article
• ISSN: 0927-0248
• DOI: 10.1016/s0927-0248(00)00078-7