✦ LIBER ✦

Electron-beam-induced current study of grain boundaries in multicrystalline silicon

✍ Scribed by Chen, J.; Sekiguchi, T.; Yang, D.; Yin, F.; Kido, K.; Tsurekawa, S.

Book ID: 120675060
Publisher: American Institute of Physics
Year: 2004
Tongue: English
Weight: 933 KB
Volume: 96
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.1797548

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Electron-beam-induced current study of s

Electron-beam-induced current study of small-angle grain boundaries in multicrystalline silicon

✍ J. Chen; T. Sekiguchi; R. Xie; P. Ahmet; T. Chikyo; D. Yang; S. Ito; F. Yin 📂 Article 📅 2005 🏛 Elsevier Science 🌐 English ⚖ 297 KB

Electron-beam-induced current study of h

Electron-beam-induced current study of hydrogen passivation on grain boundaries in multicrystalline silicon: Influence of GB character and impurity contamination

✍ Jun Chen; Deren Yang; Zhenqiang Xi; Takashi Sekiguchi 📂 Article 📅 2005 🏛 Elsevier Science 🌐 English ⚖ 394 KB

The impacts of grain boundary (GB) character and impurity contamination level on the hydrogen passivation of GBs in multicrystalline silicon (mc-Si) were studied by means of an electron-beam-induced current (EBIC) technique. In mc-Si with a low contamination of Fe, the 300 K EBIC contrast of all kin

Electric dipole spin resonance of grain

Electric dipole spin resonance of grain boundaries in multicrystalline silicon

✍ Schimpf, K. ;Palm, J. ;Alexander, H. 📂 Article 📅 1994 🏛 John Wiley and Sons 🌐 English ⚖ 381 KB

Enhanced diffusion of phosphorus at grai

Enhanced diffusion of phosphorus at grain boundaries in multicrystalline silicon

✍ K. Schimpf; Dr. J. Palm; Prof. Dr. H. Alexander 📂 Article 📅 1994 🏛 John Wiley and Sons 🌐 English ⚖ 469 KB

Mapping of minority carrier lifetime dis

Mapping of minority carrier lifetime distributions in multicrystalline silicon using transient electron-beam-induced current

✍ Kushida, T.; Tanaka, S.; Morita, C.; Tanji, T.; Ohshita, Y. 📂 Article 📅 2012 🏛 Oxford University Press 🌐 English ⚖ 218 KB

Investigation of Minority Carrier Diffus

Investigation of Minority Carrier Diffusion Length in Multicrystalline Silicon by Quantitative Electron Beam Induced Current Mapping

✍ Barhdadi, A.; Sivoththaman, S.; Barbe, M.; Rodot, M.; Maurice, J.L. 📂 Article 📅 1994 🏛 Trans Tech Publications, Ltd. 🌐 English ⚖ 672 KB