✦ LIBER ✦

Electrical observation of deep traps in high-/spl kappa//metal gate stack transistors

✍ Scribed by H. Harris; R. Choi; J. Sim; C. Young; P. Majhi; B. Lee; G. Bersuker

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Measurement of the interface trap and di

✍ A. Neugroschel; G. Bersuker 📂 Article 📅 2005 🏛 IEEE 🌐 English ⚖ 257 KB

Observation of Slow Oxide Traps at MOSFE

✍ Heung-Jae Cho; Younghwan Son; Byoungchan Oh; Sanghoon Lee; Jong-Ho Lee; Byung-Go 📂 Article 📅 2010 🏛 IEEE 🌐 English ⚖ 753 KB

The Electrical and Interfacial Propertie

✍ Chang, I.Y.-K.; Sheng-Wen You, ; Pi-Chun Juan, ; Ming-Tsong Wang, ; Lee, J.Y.-M. 📂 Article 📅 2009 🏛 IEEE 🌐 English ⚖ 204 KB

Observations in trapping characteristics

✍ J.C. Liao; Y.K. Fang; Y.T. Hou; W.H. Wu; C.L. Hung; P.F. Hsu; K.C. Lin; K.T. Hua 📂 Article 📅 2008 🏛 Elsevier Science 🌐 English ⚖ 493 KB

Transient Charging and Discharging Behav

✍ Wei-Hao Wu; Bing-Yue Tsui; Mao-Chieh Chen; Yong-Tian Hou; Yin Jin; Tao, H.-J.; S 📂 Article 📅 2007 🏛 IEEE 🌐 English ⚖ 415 KB