𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Electrical effects of residual defects in Si after high energy implantation of Ge+ ions and annealing

✍ Scribed by R. Kögler; J. von Borany; D. Panknin; W. Skorupa


Book ID
113285283
Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
393 KB
Volume
89
Category
Article
ISSN
0168-583X

No coin nor oath required. For personal study only.


📜 SIMILAR VOLUMES