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Electrical Characterization of InGaN/GaN Multiple-Quantum-Well Structures by Thermal Admittance Spectroscopy

✍ Scribed by N.D. Nguyen; M. Schmeits; M. Germain; B. Schineller; M. Heuken

Publisher: John Wiley and Sons
Year: 2003
Tongue: English
Weight: 351 KB
Volume: 0
Category: Article
ISSN: 1862-6351
DOI: 10.1002/pssc.200390045

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