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Electrical characterization of heavily doped polycrystalline silicon for high-frequency bipolar transistor application

โœ Scribed by Kim, D.M.; Feng Qian; Bickford, C.U.; Hee Kyun Park


Book ID
114596053
Publisher
IEEE
Year
1987
Tongue
English
Weight
881 KB
Volume
34
Category
Article
ISSN
0018-9383

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