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Electrical characterization of defects introduced in n-Si during electron beam deposition of Pt

โœ Scribed by Auret, F. D.; Coelho, S. M. M.; Nel, J. M.; Meyer, W. E.

Book ID
118766399
Publisher
John Wiley and Sons
Year
2012
Tongue
English
Weight
515 KB
Volume
209
Category
Article
ISSN
0031-8965

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