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Electrical characterization of defects introduced during metallization processes in n-type germanium

✍ Scribed by F.D. Auret; S.M.M. Coelho; P.J. Janse van Rensburg; C. Nyamhere; W.E. Meyer

No coin nor oath required. For personal study only.

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Electrical characterization of defects i

✍ F.D. Auret; W.E. Meyer; S. Coelho; M. Hayes; J.M. Nel 📂 Article 📅 2006 🏛 Elsevier Science 🌐 English ⚖ 152 KB

Electrical characterization of defects i

✍ F.D. Auret; P.J. Janse van Rensburg; M. Hayes; J.M. Nel; S. Coelho; W.E. Meyer; 📂 Article 📅 2007 🏛 Elsevier Science 🌐 English ⚖ 140 KB