✦ LIBER ✦

Electrical characterization of defects introduced during electron beam deposition of Schottky contacts on n-type Ge

✍ Scribed by F.D. Auret; W.E. Meyer; S. Coelho; M. Hayes; J.M. Nel

Publisher: Elsevier Science
Year: 2006
Tongue: English
Weight: 152 KB
Volume: 9
Category: Article
ISSN: 1369-8001
DOI: 10.1016/j.mssp.2006.08.008

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Thermal stability of Co, Ni, Pt or Ru Sc

Thermal stability of Co, Ni, Pt or Ru Schottky contacts on n-Si and defects introduced thereon during contacts fabrication using electron beam deposition

✍ Cloud Nyamhere; A. Chawanda; A.G.M. Das; F.D. Auret; M. Hayes 📂 Article 📅 2007 🏛 Elsevier Science 🌐 English ⚖ 264 KB

When using Schottky barrier diodes (SBDs) on silicon (Si) to study the thermal stability of radiation-induced defects, point defects injection into the silicon substrate can occur at temperatures where silicidation occurs. These injected point defects can react with the radiation-induced defects and

Electrical characterization of defects i

Electrical characterization of defects introduced during metallization processes in n-type germanium

✍ F.D. Auret; S.M.M. Coelho; P.J. Janse van Rensburg; C. Nyamhere; W.E. Meyer 📂 Article 📅 2008 🏛 Elsevier Science 🌐 English ⚖ 326 KB

Thermal stability study of palladium and

Thermal stability study of palladium and cobalt Schottky contacts on n-Ge (1 0 0) and defects introduced during contacts fabrication and annealing process

✍ A. Chawanda; C. Nyamhere; F.D. Auret; W. Mtangi; T.T. Hlatshwayo; M. Diale; J.M. 📂 Article 📅 2009 🏛 Elsevier Science 🌐 English ⚖ 340 KB

Electrical characterization of Au Schott

Electrical characterization of Au Schottky contact on n-type Cd0.99Mn0.01Te

✍ J Szatkowski; E Płaczek-Popko; B Bieg; A Hajdusianek; S Kuźmiński 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 161 KB