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Electrical Characterization of Defects Introduced During Sputter Deposition of Schottky Contacts onn-type Ge

✍ Scribed by F.D. Auret; S. Coelho; W.E. Meyer; C. Nyamhere; M. Hayes; J.M. Nel

Book ID: 107454984
Publisher: Springer US
Year: 2007
Tongue: English
Weight: 186 KB
Volume: 36
Category: Article
ISSN: 0361-5235
DOI: 10.1007/s11664-007-0245-y

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