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Electrical Characteristics and Thermal Stability of Metal Gate Electrode for Advanced MOS Devices

✍ Scribed by Chang-Ta Yang; Kuei-Shu Chang-Liao; Hsin-Chun Chang; Chung-Hao Fu; Tien-Ko Wang; Wen-Fa Tsai; Chi-Fong Ai; Wen-Fa Wu


Book ID
114619181
Publisher
IEEE
Year
2008
Tongue
English
Weight
469 KB
Volume
55
Category
Article
ISSN
0018-9383

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