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Electrical characteristics and reliability properties of metal-oxide-semiconductor field-effect transistors with Dy[sub 2]O[sub 3] gate dielectric

✍ Scribed by Chang, Sheng-Chih; Deng, Shao-You; Lee, Joseph Ya-Min

Book ID: 120419449
Publisher: American Institute of Physics
Year: 2006
Tongue: English
Weight: 323 KB
Volume: 89
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.2217708

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