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Electrical characteristics and irradiation sensitivity of IGFETs with rapidly grown ultrathin gate dielectrics

✍ Scribed by Wright, P.J.; Moslehi, M.M.; Saraswat, K.C.

Book ID: 114538434
Publisher: IEEE
Year: 1988
Tongue: English
Weight: 306 KB
Volume: 35
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.8853

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