For (~ochralski-grown silicon, oxygen is the basic impurity, with its concentration exceeding IO Is cm-~. The complexing of oxygen upon heat treatment presents a long-standing challenge to our understanding of the physics of defects in silicon. In this paper the oxygen-related centres generated by l
β¦ LIBER β¦
Electrical and infrared spectroscopic investigations of oxygen-related donors in silicon
β Scribed by Wruck, D. ;Gaworzewski, P.
- Publisher
- John Wiley and Sons
- Year
- 1979
- Tongue
- English
- Weight
- 545 KB
- Volume
- 56
- Category
- Article
- ISSN
- 0031-8965
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