Pad Surface Roughness and Slurry Particl
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C. Wang; P. Sherman; A. Chandra; D. Dornfeld
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Article
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2005
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International Academy for Production Engineering
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English
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The ability to predict material removal rates in chemical mechanical planarization (CMP) is an essential ingredient for low cost, high quality IC chips. Recently, models that address the slurry particles have been proposed. We address three such models. The first two differ only in how the number of