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Effect of ytterbium inclusion in hafnium oxide on the structural and electrical properties of the high-k gate dielectric

✍ Scribed by CHEN, Shuai; LIU, Zhengtang; FENG, Liping; CHE, Xingsen; ZHAO, Xiaoru


Book ID
124135246
Publisher
Elsevier Science
Year
2014
Tongue
English
Weight
1014 KB
Volume
32
Category
Article
ISSN
1002-0721

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Effect of Ce4+substitution on the struct
✍ Augustin, C. O. ;Hema, K. ;Berchmans, L. John ;Kalai Selvan, R. ;Saraswathi, R. πŸ“‚ Article πŸ“… 2005 πŸ› John Wiley and Sons 🌐 English βš– 208 KB

## Abstract The structural, electrical and dielectric properties of a series of Ni~1–__x__~Ce__~x~__Al~2~O~4~ (__x__ = 0.0, 0.2, 0.4, 0.6, 0.8) compositions have been studied. The samples were prepared by a novel glycine–nitrate combustion synthesis route. The substitution of Ce^4+^ for Ni^2+^ resu