𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Effect of Stress Induced Defects on Electrical Properties of Czochralski Grown Silicon

✍ Scribed by Misiuk, Andrzej; Jung, W.; Surma, Barbara; Jun, J.; Rozental, M.


Book ID
120511083
Publisher
Trans Tech Publications, Ltd.
Year
1997
Tongue
English
Weight
416 KB
Volume
57-58
Category
Article
ISSN
1662-9779

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES