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Effect of Stress on Creation of Defects in Annealed Czochralski Grown Silicon

✍ Scribed by Misiuk, A.

Publisher: John Wiley and Sons
Year: 1999
Tongue: English
Weight: 167 KB
Volume: 171
Category: Article
ISSN: 0031-8965
DOI: 10.1002/(sici)1521-396x(199901)171:1<191::aid-pssa191>3.0.co;2-y

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