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Effect of pulsed bias on TiO2 thin films prepared on silicon by arc ion plating and simulation of pulsed plasma sheath dynamics

✍ Scribed by Min Zhang; Lei Liu; Xiaoxu Yang; Feifei Xu; Guoqiang Lin; Chuang Dong


Book ID
118501897
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
858 KB
Volume
521
Category
Article
ISSN
0040-6090

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