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Effect of deposition rate and thickness on the structural and electrical properties of evaporated Ni/glass and Ni/Si(1 0 0) thin films

✍ Scribed by M. Hemmous; A. Layadi; A. Guittoum; A. Bourzami; A. Benabbas

Publisher: Elsevier Science
Year: 2008
Tongue: English
Weight: 304 KB
Volume: 39
Category: Article
ISSN: 0026-2692
DOI: 10.1016/j.mejo.2008.03.005

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