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Growth and morphology of ultra-thin Ni films on Pd(1 0 0)

✍ Scribed by C. Parra; P. Häberle; M.D. Martins; W.A.A. Macedo


Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
310 KB
Volume
39
Category
Article
ISSN
0026-2692

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✦ Synopsis


A series of Ni films with thickness from 0.2 monolayers (ML) to 12.5 ML were epitaxially grown on a Pd(1 0 0) substrate at room temperature. Growth and morphology were investigated by scanning tunneling microscopy (STM), reflection-high-energy-electron diffraction (RHEED) and Auger electron spectroscopy (AES). We found that the strain relief mechanism for the tetragonal distorted films is related with the appearance of 1 A ˚high-filaments.


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