Growth and morphology of ultra-thin Ni f
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C. Parra; P. HΓ€berle; M.D. Martins; W.A.A. Macedo
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Article
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2008
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Elsevier Science
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English
β 310 KB
A series of Ni films with thickness from 0.2 monolayers (ML) to 12.5 ML were epitaxially grown on a Pd(1 0 0) substrate at room temperature. Growth and morphology were investigated by scanning tunneling microscopy (STM), reflection-high-energy-electron diffraction (RHEED) and Auger electron spectros