Effect of Al incorporation on the performance and reliability of p-type metal-oxide-semiconductor field effect transistors

✍ Scribed by Yoon-Uk Heo; Tae-Young Jang; Donghyup Kim; Jun Suk Chang; Manh Cuong Nguyen; Musarrat Hasan; Hoichang Yang; Jae Kyeong Jeong; Rino Choi; Changhwan Choi

• Book ID: 118501879
• Publisher: Elsevier Science
• Year: 2012
• Tongue: English
• Weight: 700 KB
• Volume: 521
• Category: Article
• ISSN: 0040-6090
• DOI: 10.1016/j.tsf.2012.02.039