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Edge misfit dislocations in GexSi1 −x/Si(001) (x∼ 1) heterostructures: role of buffer GeySi1 −y(y

✍ Scribed by Yu. B. Bolkhovityanov; A. K. Gutakovskii; A. S. Deryabin; L. V. Sokolov


Book ID
111447406
Publisher
SP MAIK Nauka/Interperiodica
Year
2011
Tongue
English
Weight
789 KB
Volume
53
Category
Article
ISSN
1063-7834

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Kinetic critical thickness for surface w
✍ D.D. Perovic´; B. Bahierathan; H. Lafontaine; D.C. Houghton; D.W. McComb 📂 Article 📅 1997 🏛 Elsevier Science 🌐 English ⚖ 539 KB

The kinetic critical thicknesses for surface wave formation and misfit dislocation generation in UHVCVD-grown GeSi/Si have been quantitatively determined using microscopical techniques. A refined morphological instability theory has been developed using a coupled continuum/atomistic treatment that i