Heteroepitaxy of GexSi1 −x(x∼ 0.4–0.5) films on Si(001) substrates misoriented to (111): Formation of short edge misfit dislocations alone in the misorientation direction

✍ Scribed by Yu. B. Bolkhovityanov; A. S. Deryabin; A. K. Gutakovskii; L. V. Sokolov

• Book ID: 111446744
• Publisher: SP MAIK Nauka/Interperiodica
• Year: 2010
• Tongue: English
• Weight: 515 KB
• Volume: 52
• Category: Article
• ISSN: 1063-7834
• DOI: 10.1134/s1063783410010063