Formation of misfit edge dislocations in GexSi1 −xfilms (x∼ 0.4–0.5) grown on tilted Si(001) → (111) substrates

✍ Scribed by Yu. B. Bolkhovityanov; A. K. Gutakovskii; A. S. Deryabin; L. V. Sokolov

• Book ID: 111446243
• Publisher: SP MAIK Nauka/Interperiodica
• Year: 2008
• Tongue: English
• Weight: 444 KB
• Volume: 50
• Category: Article
• ISSN: 1063-7834
• DOI: 10.1134/s1063783408100120