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Admittance spectroscopy analysis of the conduction band offsets in Si/Si[sub 1−x−y]Ge[sub x]C[sub y] and Si/Si[sub 1−y]C[sub y] heterostructures

✍ Scribed by Singh, D. V.; Rim, K.; Mitchell, T. O.; Hoyt, J. L.; Gibbons, J. F.

Book ID: 121750115
Publisher: American Institute of Physics
Year: 1999
Tongue: English
Weight: 346 KB
Volume: 85
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.369219

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