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X-ray photoelectron spectroscopic evaluation of valence band offsets for strained Si[sub 1âx]Ge[sub x], Si[sub 1ây]C[sub y], and Si[sub 1âxây]Ge[sub x]C[sub y] on Si(001)

✍ Scribed by Kim, Myeongcheol; Osten, H. J.

No coin nor oath required. For personal study only.

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X-ray photoelectron spectroscopic evaluation of valence band offsets for strained Si[sub 1âx]Ge[sub x], Si[sub 1ây]C[sub y], and Si[sub 1âxây]Ge[sub x]C[sub y] on Si(001)