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EBIC investigations of defect distribution in ELOG GaN films

✍ Scribed by E.B. Yakimov; P.S. Vergeles; A.V. Govorkov; A.Y. Polyakov; N.B. Smirnov; In-Hwan Lee; Cheul Ro Lee; S.J. Pearton

No coin nor oath required. For personal study only.

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