SEM/EBIC investigations of extended defect system in GaN epilayers

✍ Scribed by N. M. Shmidt; V. V. Sirotkin; A. A. Sitnikova; O. A. Soltanovich; R. V. Zolotareva; E. B. Yakimov

• Publisher: John Wiley and Sons
• Year: 2005
• Tongue: English
• Weight: 418 KB
• Volume: 2
• Category: Article
• ISSN: 1862-6351
• DOI: 10.1002/pssc.200460506