On the origin of EBIC defect contrast in silicon. A reflection on injection and temperature dependent investigations

✍ Scribed by Kittler, M. ;Seifert, W.

• Publisher: John Wiley and Sons
• Year: 1993
• Tongue: English
• Weight: 394 KB
• Volume: 138
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.2211380240